Honeywell’s
POMS Explorer™
Based on Discoverant™ from
Aegis Analytical Corporation
POMS Explorer™ integrates powerful statistics,
graphics, visual analytics and connectivity technology
to provide direct, read-only access and conditioning
of process data. Using a patented data modeling process,
POMS Explorer™ maps and maintains the relationships
between the data from the systems you already have in
place-including POMS MES, POMS CMS, LIMS, ERP and Process
Control, delivering a complete environment for data-intensive
decision making, all the way from raw materials to finished
product. POMS Explorer™ improves the management
and tracking of process changes and allows better compliance
with increasingly stringent regulatory requirements
for process validation, trend analysis, change control
and documentation. It also provides a validatable software
system with superior timesaving capabilities for reviewing
in-process critical parameter conformance for product
lot release.
Visual Process Signatures (VPS) Provides
high quality, animated visualizations of the parameter
interactions among batches, over time
or in relation to the value of a particular parameter.
VPS is an excellent way to learn more about the behavior
of your manufacturing process and how to better control
it. By providing an overview of the parameter interactions,
the visualizations can identify parameters that warrant
further analysis.
The Challenge
POMS EXPLORER™ Addresses
Frequently, process manufacturers need to identify
all the critical process parameters to determine their
combined effects on the process outcome. They also want
useful methods for reporting critical process parameters
and outcomes, including process signatures, for making
informative comparisons between groups of batches.
Using POMS Explorer’s analysis and visualization
capabilities, manufacturers are able to efficiently
analyze data from many batches from one manufacturing
campaign.
POMS Explorer Opens Their Eyes
The manufacturing-related data needed for statistical
analysis and visualization at a facility is often stored
in several locations. Supervisory Control and Data
Acquisition (SCADA) and Distributed Control Systems
(DCS) are being used to monitor instruments, control
process parameters at their set points, and to archive
these measurements in a process data historian. Associated
lot-history and product-quality data may be found in
several other locations such as in LIMS and ERP systems,
as well as on paper records.
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